CeraNova maintains extensive materials characterization and measurement capabilities. In addition to our state-of-the-art characterization tools, CeraNova has long-established connections to leading local universities, laboratories, and vendors with expertise in characterization and evaluation methods such as electron microscopy (SEM and TEM), X-ray diffractometry, thermal diffusivity/conductivity, particle size and particle size distribution analysis, elemental and chemical analysis, and mechanical properties testing.
CeraNova’s equipment is used daily to evaluate precision parts. This equipment is also available for toll services by individual arrangement. Contact CeraNova for more information.
Optical microscopy and image analysis software tools are used on a routine basis to examine microstructural features and to measure grain size and grain size distribution:
• Olympus BX60P transmitted and reflected polarized light microscope with digital image acquisition capability is used to examine powders and consolidated materials
• Struers RotoPol automatic polisher is used to prepare polished surfaces for examination by optical microscopy and for spectrographic analysis
Spectrographic Analysis: UV, Visible, IR
CeraNova has two spectrometers for measurement of in-line transmittance:
• A UV/VIS/NIR spectrometer for measurements in the UV, visible and near IR portions of the spectrum
• A FT/IR spectrometer for measurements in the mid-wave infrared and beyond
Metrology and Surface Analysis
• Coordinate Measuring Machine (CMM)—CeraNova’s high-performance CMM is equipped with an advanced multi-sensor compatible controller and scanning capability. Its unique design provides optimum stiffness for very precise measurements, with an accuracy of better than 2 µm.
• Optical Profilometry—Equipment for surface evaluation includes a profilometer for measuring surface roughness at the Angstrom level and an interferometer for measuring the departure of the surface figure or transmitted wavefront to λ/10 or less. This capability, along with optical microscope inspection, gives CeraNova the ability to monitor a variety of material and surface conditions during both processing and final quality control steps.
Dilatometry and Thermal Expansion
A Theta pushrod dilatometer is used for thermal expansion measurement, as well as for determining densification and sintering behavior. The dilatometer is capable of 1600°C in air, inert, and vacuum atmospheres and is equipped with computer data acquisition.
Mechanical Properties Testing
CeraNova maintains a close working relationship with several laboratories capable of extensive mechanical property measurements, including Modulus of Rupture, Biaxial Flexure, Indentation Hardness, and various Fracture Toughness tests. In addition to testing in ambient conditions, many tests can also be performed under controlled atmosphere and at elevated temperature.